[IEEE 2010 Asia Communications and Photonics Conference and Exhibition (ACP 2010) - Shanghai, China (2010.12.8-2010.12.12)] Asia Communications and Photonics Conference and Exhibition - Influence of the thickness variation of the SiOx layer on the Si quantum dots based MOSLED
Lai, Bo-Han, Cheng, Chih-Hsien, Lin, Gong-RuYear:
2010
Language:
english
DOI:
10.1109/acp.2010.5682837
File:
PDF, 148 KB
english, 2010