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[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Static and low-frequency noise characterization of ultrathin SOI with very thin BOX in pseudo-MOSFET configuration
Diab, A., Ionica, I., Cristoloveanua, S., Allibert, F., Bae, Y. H., Chroboczek, J. A., Ghibaudo, G.Year:
2011
Language:
english
DOI:
10.1109/isdrs.2011.6135244
File:
PDF, 606 KB
english, 2011