[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Geometry- and bias-dependence of leakage current and overlap capacitance in a-Si:H TFTs
Nathan, A., Austin, M., Pereira, D., Park, B., Murthy, R.V.R.Volume:
2
Year:
1999
Language:
english
DOI:
10.1109/icmel.2000.838733
File:
PDF, 224 KB
english, 1999