[IEEE 2002 IEEE International Symposium on Circuits and Systems - Phoenix-Scottsdale, AZ, USA (26-29 May 2002)] 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353) - On the use of hash functions for defect detection in textures for in-camera web inspection systems
Baykal, I.C., Muscedere, R., Jullien, G.A.Volume:
5
Year:
2002
Language:
english
DOI:
10.1109/iscas.2002.1010791
File:
PDF, 495 KB
english, 2002