[IEEE 27th Annual Proceedings., International Reliability...

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[IEEE 27th Annual Proceedings., International Reliability Physics Symposium - Phoenix, AZ, USA (11-13 April 1989)] 27th Annual Proceedings., International Reliability Physics Symposium - Extensions of the effective thickness theory of oxide breakdown

Coleman, D.J., Hunter, W.R., Brown, G.A., Chen, I.-C.
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Year:
1989
Language:
english
DOI:
10.1109/relphy.1989.36315
File:
PDF, 336 KB
english, 1989
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