[IEEE 2013 5th IEEE International Memory Workshop (IMW) -...

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[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - Highly reliable ReRAM technology with encapsulation process for 20nm and beyond

Seong, Dong-Jun, Yang, Min Kyu, Ju, Hyunsu, Lee, Jung Moo, Kim, Eunmi, Jung, Seungjae, Lee, Jinwoo, Kim, Gun Hwan, Choi, Seol, Zhang, Lijie, Park, Seong-Geon, Kang, Youn Seon, Baek, In-Gyu, Choi, Jung
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Year:
2013
Language:
english
DOI:
10.1109/imw.2013.6582093
File:
PDF, 998 KB
english, 2013
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