[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - The behavioral simulation of EMI system by DNA method at the system level
Chen Wenqing,, Su Donglin,, Sun Wei,, Hou Yanchun,Year:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652093
File:
PDF, 255 KB
english, 2008