[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - New insight into tantalum pentoxide Metal-Insulator-Metal (MIM) capacitors: Leakage current modeling, self-heating, reliability assessment and industrial applications
Martinez, V., Besset, C., Monsieur, F., Ney, D., Montes, L., Ghibaudo, G.Year:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558891
File:
PDF, 172 KB
english, 2008