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[IEEE International Symposium on VLSI Technology, Systems and Applications - Taipei, Taiwan (17-19 May 1989)] International Symposium on VLSI Technology, Systems and Applications - Testing VLSI chips with weighted random patterns
Waicukauski, J.A., Motika, F.Year:
1989
Language:
english
DOI:
10.1109/vtsa.1989.68602
File:
PDF, 457 KB
english, 1989