[IEEE International Symposium on VLSI Technology, Systems...

  • Main
  • [IEEE International Symposium on VLSI...

[IEEE International Symposium on VLSI Technology, Systems and Applications - Taipei, Taiwan (17-19 May 1989)] International Symposium on VLSI Technology, Systems and Applications - Testing VLSI chips with weighted random patterns

Waicukauski, J.A., Motika, F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1989
Language:
english
DOI:
10.1109/vtsa.1989.68602
File:
PDF, 457 KB
english, 1989
Conversion to is in progress
Conversion to is failed