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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Test Structure and Testing of the Microsoft XBOX 360¿ Processor High Speed Front Side Bus
Pham, Tung, Koehler, Brian, Young, Daniel, Bushard, LouisYear:
2006
Language:
english
DOI:
10.1109/test.2006.297639
File:
PDF, 188 KB
english, 2006