![](/img/cover-not-exists.png)
[IEEE 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel (IEEEI) - Eilat, Israel (2008.12.3-2008.12.5)] 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel - A general class of lower bounds on the probability of error in multiple hypothesis testing
Routtenberg, Tirza, Tabrikian, JosephYear:
2008
Language:
english
DOI:
10.1109/eeei.2008.4736635
File:
PDF, 1.39 MB
english, 2008