A Case Study of Problems in JEDEC HBM ESD Test Standard

IEEE Transactions on Device and Materials Reliability 2009 / 09 Vol. 9; Iss. 3

A Case Study of Problems in JEDEC HBM ESD Test Standard

Mingxu Huo,, Qing Guo,, Yan Han,, Lei Shen,, Qi Liu,, Bo Song,, Qingrong Ma,, Kehan Zhu,, Yehui Shen,, Xiaoyang Du,, Shurong Dong,
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Volume:
9
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2009.2027124
Date:
September, 2009
File:
PDF, 1.04 MB
english, 2009
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