Recombination Effect as Component of Residual Defect in...

Journal of Nuclear Science and Technology 1992 / 07 Vol. 29; Iss. 7

Recombination Effect as Component of Residual Defect in Silicon Surface Barrier Detector

KANNO, Ikuo
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Volume:
29
Language:
english
Journal:
Journal of Nuclear Science and Technology
DOI:
10.1080/18811248.1992.9731582
Date:
July, 1992
File:
PDF, 219 KB
english, 1992
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