[IEEE Comput. Soc International Conference on MEMS, NANO...

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[IEEE Comput. Soc International Conference on MEMS, NANO and Smart Systems - Banff, Alta., Canada (20-23 July 2003)] Proceedings International Conference on MEMS, NANO and Smart Systems - Multi-patch: a chip-based ion-channel assay system for drug screening

Picollet-D'hahan, N., Sauter, F., Ricoul, F., Pudda, C., Marcel, F., Sordel, T., Chatelain, F., Chartier, I.
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Year:
2003
Language:
english
DOI:
10.1109/icmens.2003.1222001
File:
PDF, 467 KB
english, 2003
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