[IEEE Comput. Soc International Conference on MEMS, NANO and Smart Systems - Banff, Alta., Canada (20-23 July 2003)] Proceedings International Conference on MEMS, NANO and Smart Systems - Multi-patch: a chip-based ion-channel assay system for drug screening
Picollet-D'hahan, N., Sauter, F., Ricoul, F., Pudda, C., Marcel, F., Sordel, T., Chatelain, F., Chartier, I.Year:
2003
Language:
english
DOI:
10.1109/icmens.2003.1222001
File:
PDF, 467 KB
english, 2003