Microscopic Modeling of RF Noise in Laterally Asymmetric Channel MOSFETs
Rengel, Raúl, Martin, María J., Danneville, FrançoisVolume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2082488
Date:
January, 2011
File:
PDF, 156 KB
english, 2011