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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - New reliability mechanisms in memory design for sub-22nm technologies
Aymerich, N., Asenov, A., Brown, A., Canal, R., Cheng, B., Figueras, J., Gonzalez, A., Herrero, E., Markov, S., Miranda, M., Pouyan, P., Ramirez, T., Rubio, A., Vatajelu, I., Vera, X., Wang, X., ZuberYear:
2011
Language:
english
DOI:
10.1109/iolts.2011.5993820
File:
PDF, 429 KB
english, 2011