[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Experimental Study of Charge Displacement in Nitride Layer and its Effect on Threshold Voltage Instability of Advanced Flash Memory Devices
Tao, Guoqiao, Nath, Som, Ouvrard, Cedric, Chauveau, Helene, Dormans, Do, Verhaar, RobYear:
2007
Language:
english
DOI:
10.1109/ipfa.2007.4378061
File:
PDF, 3.65 MB
english, 2007