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Study of the influences of molecular planarity and aluminum evaporation rate on the performances of electrical memory devices
Liu, Hongzhang, Bo, Rongcheng, Liu, Haifeng, Li, Najun, Xu, Qingfeng, Li, Hua, Lu, Jianmei, Wang, LihuaVolume:
2
Year:
2014
Language:
english
Journal:
Journal of Materials Chemistry C
DOI:
10.1039/c4tc00311j
File:
PDF, 748 KB
english, 2014