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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Test Generation for Designs with On-Chip Clock Generators
Lin, Xijiang, Kassab, MarkYear:
2009
Language:
english
DOI:
10.1109/ats.2009.46
File:
PDF, 428 KB
english, 2009