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[IEEE 2008 International Conference on Microelectronics - ICM - Sharjah, United Arab Emirates (2008.12.14-2008.12.17)] 2008 International Conference on Microelectronics - Electrical study of NiFe/Al2O3/Si tunnel diodes for magnetic memories
Benabderrahmane, Rabia, Kanoun, Mehdi, Bruyant, Nicolas, Achard, Herve, Baraduc, Claire, Bsiesy, AhmadYear:
2008
Language:
english
DOI:
10.1109/icm.2008.5393832
File:
PDF, 1.35 MB
english, 2008