[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Improving the Fault Tolerance of Nanometric PLA Designs
Angiolini, Federico, Jamaa, M. Haykel Ben, Atienza, David, Benini, Luca, de Micheli, GiovanniYear:
2007
Language:
english
DOI:
10.1109/date.2007.364654
File:
PDF, 464 KB
english, 2007