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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods
Warren, Kevin M., Wilkinson, Jeffrey D., Weller, Robert A., Sierawski, Brian D., Reed, Robert A., Porter, Mark E., Mendenhall, Marcus H., Schrimpf, Ron D., Massengill, Lloyd W.Year:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558931
File:
PDF, 478 KB
english, 2008