The Energy-Driven Hot-Carrier Degradation Modes of nMOSFETs
Guerin, ChloÉ, Huard, Vincent, Bravaix, AlainVolume:
7
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2007.901180
Date:
June, 2007
File:
PDF, 644 KB
english, 2007