[IEEE 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Quebec City, QC, Canada (2008.10.26-2008.10.29)] 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition

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