Reassessing the Mechanisms of Negative-Bias Temperature...

IEEE Transactions on Device and Materials Reliability 2011 / 03 Vol. 11; Iss. 1

Reassessing the Mechanisms of Negative-Bias Temperature Instability by Repetitive Stress/Relaxation Experiments

Ang, D. S., Teo, Z. Q., Ho, T. J. J., Ng, C. M.
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Volume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2010.2067216
Date:
March, 2011
File:
PDF, 1.18 MB
english, 2011
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