[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - NBTI-channel hot carrier effects in PMOSFETs in advanced CMOS technologies
La Rosa, G., Guarin, F., Rauch, S., Acovic, A., Lukaitis, J., Crabbe, E.Year:
1997
Language:
english
DOI:
10.1109/relphy.1997.584274
File:
PDF, 445 KB
english, 1997