![](/img/cover-not-exists.png)
[IEEE 2013 IEEE Electrical Insulation Conference (EIC) - Ottawa, ON, Canada (2013.06.2-2013.06.5)] 2013 IEEE Electrical Insulation Conference (EIC) - Reliability estimation for populations with limited and heavily censored failure information
Chmura, Lukasz, Morshuis, P. H. F., Gulski, E., Smit, J. J., Janssen, AntonYear:
2013
Language:
english
DOI:
10.1109/eic.2013.6554224
File:
PDF, 467 KB
english, 2013