Defect Size Effect and Defect Band Conduction of Ultrathin...

IEEE Electron Device Letters 2009 / 04 Vol. 30; Iss. 4

Defect Size Effect and Defect Band Conduction of Ultrathin Oxides After Degradation and Breakdown

Mingzhen Xu,, Changhua Tan,
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Volume:
30
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2014183
Date:
April, 2009
File:
PDF, 101 KB
english, 2009
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