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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - A method to adapt Zth-junction-to-ambient curves to varying ambient conditions
Schweitzer, DirkYear:
2012
Language:
english
DOI:
10.1109/stherm.2012.6188850
File:
PDF, 395 KB
english, 2012