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[IEEE Nanoscale Phenomena in Polar Materials - Vancouver, BC, Canada (2011.07.24-2011.07.27)] 2011 International Symposium on Applications of Ferroelectrics (ISAF/PFM) and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials - Electrode size effect under PFM characterization of PZT-film on silicon structures with micro- and nanometric top electrodes
Bravina, S. L., Morozovsky, N. V., Eliseev, E. A., Morozovska, A. N., Costecalde, J., Soyer, C., Remiens, D., Deresmes, D.Year:
2011
Language:
english
DOI:
10.1109/isaf.2011.6014002
File:
PDF, 851 KB
english, 2011