[IEEE 2011 23rd International Conference on Microelectronics (ICM) - Hammamet, Tunisia (2011.12.19-2011.12.22)] ICM 2011 Proceeding - A scheme for measuring and extracting level-1 parameter of FET device applied toward POSFET sensors array
Sinha, Arun Kumar, Valle, MaurizioYear:
2011
Language:
english
DOI:
10.1109/icm.2011.6177351
File:
PDF, 1.48 MB
english, 2011