Statistical Characterization of Noise and Interference in...

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications 2013 / 08 Vol. 60; Iss. 8

Statistical Characterization of Noise and Interference in NAND Flash Memory

Moon, Jaekyun, No, Jaehyeong, Lee, Sangchul, Kim, Sangsik, Choi, Seokhwan, Song, Yunheub
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2013.2239116
Date:
August, 2013
File:
PDF, 2.42 MB
english, 2013
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