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[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Electrical field dependence of data retention in high-k interpoly dielectrics
Chung, Chun-Hyung, Lim, Seung-Hyun, Lim, Sang-Wook, Kim, Young-Sun, Choi, SY, Moon, Joo-TaeYear:
2009
Language:
english
DOI:
10.1109/irps.2009.5173264
File:
PDF, 258 KB
english, 2009