Use of multiple emission lines and principal component regression for quantitative analysis in inductively coupled plasma atomic emission spectrometry with charge coupled device detection
Sadler, Daran A., Littlejohn, DavidVolume:
11
Year:
1996
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/ja9961101105
File:
PDF, 1.15 MB
english, 1996