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Use of multiple emission lines and principal component...

Use of multiple emission lines and principal component regression for quantitative analysis in inductively coupled plasma atomic emission spectrometry with charge coupled device detection

Sadler, Daran A., Littlejohn, David
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Volume:
11
Year:
1996
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/ja9961101105
File:
PDF, 1.15 MB
english, 1996
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