[IEEE 2013 Spanish Conference on Electron Devices (CDE) - Valladolid, Spain (2013.02.12-2013.02.14)] 2013 Spanish Conference on Electron Devices - Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes
Garcia, H., Castan, H., Duenas, S., Bailon, L., Feijoo, P. C., Pampillon, M. A., Andres, E. SanYear:
2013
Language:
english
DOI:
10.1109/cde.2013.6481398
File:
PDF, 207 KB
english, 2013