[IEEE 2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Kyoto, Japan (2012.03.5-2012.03.8)] 2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Characterization of strain fields in graphene films
Dewanto, Raden, Dale, Carl, Hu, Zhongxu, Keegan, Neil, Gallacher, Barry, Hedley, JohnYear:
2012
Language:
english
DOI:
10.1109/nems.2012.6196712
File:
PDF, 824 KB
english, 2012