[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Case studies on application of Time Resolved Imaging Emission Microscopy for backside timing analysis
Uchikado, A., Kawanab, S., Okubo, T., Shimase, A., Majima, T., Hirai, N., Ito, Y., Nakamura, T.Year:
2012
Language:
english
DOI:
10.1109/ipfa.2012.6306291
File:
PDF, 232 KB
english, 2012