[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - Statistically Aware SRAM Memory Array Design
Grossar, E., Stucchi, M., Maex, K., Dehaene, W.Year:
2006
Language:
english
DOI:
10.1109/isqed.2006.122
File:
PDF, 376 KB
english, 2006