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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Parameter controlled automatic symbolic analysis of nonlinear analog circuits
Popp, R., Oehmen, J., Hedrich, L., Barke, E.Year:
2002
Language:
english
DOI:
10.1109/date.2002.998284
File:
PDF, 1.10 MB
english, 2002