![](/img/cover-not-exists.png)
Monitoring metal ion contamination onset in hydrofluoric acid using silicon–diamond and dual silicon sensing electrode assembly
Ponnuswamy, Thomas, Chen, Jin-Jian, Xu, Fei, Chyan, OliverVolume:
126
Year:
2001
Language:
english
Journal:
The Analyst
DOI:
10.1039/b009841h
File:
PDF, 64 KB
english, 2001