[IEEE 2009 22nd International Conference on VLSI Design:...

  • Main
  • [IEEE 2009 22nd International...

[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - Defect Aware to Power Conscious Tests - The New DFT Landscape

Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/vlsi.design.2009.111
File:
PDF, 233 KB
english, 2009
Conversion to is in progress
Conversion to is failed