[IEEE InterSociety Conference on Thermal Phenomena in Electronic Systems - Las Vegas, NV, USA (23-25 May 1990)] InterSociety Conference on Thermal Phenomena in Electronic Systems - Silicon interconnect-a critical factor in device thermal management
Witzman, S., Metelski, G., Smith, K.Year:
1990
Language:
english
DOI:
10.1109/itherm.1990.113326
File:
PDF, 827 KB
english, 1990