[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA...

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[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA (2010.09.13-2010.09.16)] 2010 IEEE AUTOTESTCON - Programming approach with parallel capable instruments for test efficiency

Van, Tan, Singleton, Rodney
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Year:
2010
Language:
english
DOI:
10.1109/autest.2010.5613595
File:
PDF, 639 KB
english, 2010
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