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[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Improved circuitry for soft error correction in combinational logic in pipelined designs
Krstic, Milos, Weidling, Stefan, Petrovic, Vladimir, Goessel, MichaelYear:
2014
Language:
english
DOI:
10.1109/iolts.2014.6873678
File:
PDF, 202 KB
english, 2014