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[IEEE IEEE International Conference on Computer Systems and Applications, 2006 - (2006.03.8-2006.03.8)] IEEE International Conference on Computer Systems and Applications, 2006. - Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques
Aloul, F., Sagahyroon, A., Al Rawi, B.Year:
2006
Language:
english
DOI:
10.1109/aiccsa.2006.205123
File:
PDF, 334 KB
english, 2006