[IEEE ESSCIRC 2008 - 34th European Solid-State Circuits Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSCIRC 2008 - 34th European Solid-State Circuits Conference - Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node
Sungdae Choi,, Katsuyuki Ikeuchi,, Hyunkyung Kim,, Kenichi Inagaki,, Masami Murakata,, Nobuyuki Nishiguchi,, Makoto Takamiya,, Takayasu Sakurai,Year:
2008
Language:
english
DOI:
10.1109/esscirc.2008.4681789
File:
PDF, 445 KB
english, 2008