A comparison between GaAs and CdTe for X-ray imaging

A comparison between GaAs and CdTe for X-ray imaging

Sun, G.C., Samic, H., Bourgoin, J.C., Chambellan, D., Gal, O., Pillot, Ph.
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Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.834719
Date:
October, 2004
File:
PDF, 220 KB
english, 2004
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