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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Challenges in Reliability Assessment of Advanced CMOS Technologies
Groeseneken, Guido, Degraeve, Robin, Kaczer, Ben, Roussel, PhilippeYear:
2007
Language:
english
DOI:
10.1109/ipfa.2007.4378048
File:
PDF, 3.33 MB
english, 2007