![](/img/cover-not-exists.png)
[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - SIMS depth profile characterisation of InAlN/GaN structures
Vincze, A., Kovac, J., Behmenburg, H., Srnanek, R., Uherek, F., Donoval, D., Heuken, M.Year:
2010
Language:
english
DOI:
10.1109/asdam.2010.5666363
File:
PDF, 1.54 MB
english, 2010