![](/img/cover-not-exists.png)
[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Advanced CMOS protection device trigger mechanisms during CDM
Duvvury, C., Amerasekera, A.Year:
1995
Language:
english
DOI:
10.1109/eosesd.1995.478281
File:
PDF, 1.28 MB
english, 1995